Apogee Semiconductor AF54RHC132 Rad-Hard Quad 2-Input NAND Gate
Apogee Semiconductor AF54RHC132 Rad-Hard Quad 2-Input NAND Gate with Schmitt trigger inputs is a member of the AF54RHC logic family. The Schmitt triggers on each input provide hysteresis and allow slow-rising or noisy input signals without any fall time or input rise requirements. This NAND gate is fabricated in a 180nm CMOS process using proprietary radiation-hardening techniques. The AF54RHC132 NAND gate delivers high resiliency to Single-Event Effects (SEE) and 300krad (Si) Total Ionizing Dose (TID). This NAND gate supports class 2 ESD protection (4000V HBM and 500V CDM).
The AF54RHC132 NAND gate features built-in triple redundancy for improved reliability and proprietary cold-sparing capability with zero static power penalty. This gate includes an internal Power-On Reset (POR) circuit that ensures reliable power-up and power-down responses during cold-sparing and hot-plug operations. The AF54RHC132 NAND gate is used in space, oscillators, and medical imaging applications.
Features
- 1.65VDC to 5.5VDC supply voltage range
- Inputs tolerant up to 5.5VDC at any VCC
- Schmitt triggers on inputs for slow-rising signals
- Provides logic-level down translation to VCC
- 300krad (Si) Total Ionizing Dose (TID)
- Proprietary cold-sparing capability with zero static power penalty
- Built-in triple redundancy for enhanced reliability
- Internal Power-On Reset (POR) circuitry ensures reliable power-up and power-down responses during hot plug and cold-sparing operations
- Class 2 ESD protection (4000V HBM and 500V CDM)
- Single Event Latchup (SEL) immune to LET of 80MeV-cm2/mg
Specifications
- 100mA input clamp current
- 100mA maximum supply current
- -55°C to 150°C operating junction temperature range
Applications
- MEO/GEO satellites
- Deep space exploration
- Oscillators
- Noisy environments
- Medical imaging
Logic Diagram
Overview
Yayınlandı: 2024-08-27
| Güncellenmiş: 2024-09-03